查看完整版本: 测试简介，测试方法，及可测实性设计--希望加精

测试简介，测试方法，及可测实性设计--希望加精

Design for testability : totally 31 charpters, including:
[size=133%][size=75%]n[/size][/size][size=24pt][size=3][color=red]VLSI realizationprocess [/color][/size][/size]
[size=133%][size=75%][size=3][color=red]n[/color][/size][/size][/size][size=24pt][size=3][color=red]Verification & test [/color][/size][/size]
[size=133%][size=75%][size=3][color=red]n[/color][/size][/size][/size][size=24pt][size=3][color=red]Ideal tests [/color][/size][/size]
[size=24pt][size=3][color=red] real tests [/color][/size][/size]
[size=133%][size=75%][size=3][color=red]n[/color][/size][/size][/size][size=24pt][size=3][color=red]testing costs[/color][/size][/size]
[size=133%][size=75%][size=3][color=red]n[/color][/size][/size][/size][size=24pt][size=3][color=red]testing Rules[/color][/size][/size]
[size=133%][size=75%][size=3][color=red]n[/color][/size][/size][/size][size=24pt][size=3][color=red]A modern VLSI device - soc[/color][/size][/size]
[size=133%][size=75%][size=3][color=red]n[/color][/size][/size][/size]
[size=133%][size=75%][size=3][color=red] [/color][/size][/size][/size][size=24pt][size=3][color=red]Introduction to testing [/color][/size][/size]
[size=133%][size=75%][size=3][color=red] [/color][/size][/size][/size][size=24pt][size=3][color=red] Test methods [/color][/size][/size]
[size=133%][size=75%][size=3][color=red] [/color][/size][/size][/size][size=24pt][size=3][color=red]DFT-- Design for testability[/color][/size][/size]

the first cadfsdap[dsf

the second dadfdsa

di san zhang,  jfdsfdsa f

the forth charpter....

di wu zhang, the fifth charpter...:lol :lol

the sixth charpter.. di liu zhang

the seventh charpter...

the eighth charpter....

the ninth charptere...

the tenth charpter...

the eleventh charpter...

the twelveth charpter..

the thirteenth Charpter...

the fourteenth charpter..

the fifteenth Charpter...

the sixteenth charpter...

the seventeenth charpter...

the 18th Charpter...

the 19th Charpter..